Reliability Model of 850 nm PhC-VCSELs for FSK Modulation of SCADA Systems

This paper presents a reliability model for the photonic crystal vertical-cavity surface-emitting lasers (PhC VCSELs) for FSK modulation of SCADA systems. The PhC VCSELs are evaluated in terms of various reliability parameters, including the time to failure, modulation response and modulation bandwidth. The extracted reliability performance values of PhC VCSELs are compared with those of the conventional VCSELs. Furthermore, the PhC VCSEL shows an average of 10X improvement in time to failure than that of the similar conventional VCSEL. The results indicate that the PhC VCSEL seems to be the most optimal choice for transferring the characteristics of a carrier signal in high modulation bandwidth and reliability modulation process in SCADA system

Keywords:

Reliability model , FSK modulation , Supervisory ccontrol and data acquisition (SCADA) , Photnic crystal (PhC) , Vertical vacity surface emmiting laser (VCSEL).