ناشر تخصصی کنفرانس های ایران

لطفا کمی صبر نمایید

Publisher of Iranian Journals and Conference Proceedings

Please waite ..
Publisher of Iranian Journals and Conference Proceedings
Login |Register |Help |عضویت کتابخانه ها
Paper
Title

Nano-structural characteristics and optical and electrical properties of obliquely deposited manganese oxide thin films

Year: 1399
COI: NANOB03_019
Language: EnglishView: 81
This Paper With 13 Page And PDF Format Ready To Download

Buy and Download

با استفاده از پرداخت اینترنتی بسیار سریع و ساده می توانید اصل این Paper را که دارای 13 صفحه است به صورت فایل PDF در اختیار داشته باشید.
آدرس ایمیل خود را در کادر زیر وارد نمایید:

Authors

Fatemeh Chahshouri - School of Physics, College of Science, University of Tehran, North-Kargar Street, Tehran ۱۴۳۹۹۵۵۹۶۱, Iran
Elehe Khani - School of Physics, College of Science, University of Tehran, North-Kargar Street, Tehran ۱۴۳۹۹۵۵۹۶۱, Iran
Hadi Savaloni - School of Physics, College of Science, University of Tehran, North-Kargar Street, Tehran ۱۴۳۹۹۵۵۹۶۱, Iran
Rojan Savari - School of Physics, College of Science, University of Tehran, North-Kargar Street, Tehran ۱۴۳۹۹۵۵۹۶۱, Iran

Abstract:

In this work, manganese oxide thin films as a graded helical square tower-like (terraced) sculptured thin films with ۸, ۹, and ۱۰ arms were deposited on a glass substrate by oblique angle deposition (OAD) method. Structural and morphological characteristics of the produced samples were obtained through x-ray diffraction (XRD), atomic force microscopy (AFM), and field emission electron microscopy (FESEM) analyses. The optical and electrical properties of manganese oxide thin film were studied by hotoluminescence (PL), UVvisible (UV-VIS), and V-I measurement. The spectrophotometry analysis on both s-and p-polarized lights at ۹۰° incident light angles carried out for obtaining the optical spectra of the samples. Then, it used to calculate refractive index, energy gaps, and absorption peaks. Photoluminescence spectra for MnO films showed a ۲.۳۱, ۲.۲۸, and ۲.۲۶ eV gap energy in ۸, ۹, and ۱۰ arms. The electrical resistance measurements of these samples showed that the resistance has strongly dependent on the intensity and energy of the incident light. The electrical resistance of these samples was also investigated under green, blue, red, and light radiation with ۱۰۰ watts/cm۲ power density.

Keywords:

MnO , Oblique angle deposition , Nano sculptured layer , annealing , Optical and electrical behavior.

Paper COI Code

This Paper COI Code is NANOB03_019. Also You can use the following address to link to this article. This link is permanent and is used as an article registration confirmation in the Civilica reference:

https://civilica.com/doc/1196594/

How to Cite to This Paper:

If you want to refer to this Paper in your research work, you can simply use the following phrase in the resources section:
Chahshouri, Fatemeh and Khani, Elehe and Savaloni, Hadi and Savari, Rojan,1399,Nano-structural characteristics and optical and electrical properties of obliquely deposited manganese oxide thin films,Third International Conference on Interdisciplinary Studies in Nanotechnology,Tehran,https://civilica.com/doc/1196594

Research Info Management

Certificate | Report | من نویسنده این مقاله هستم

اطلاعات استنادی این Paper را به نرم افزارهای مدیریت اطلاعات علمی و استنادی ارسال نمایید و در تحقیقات خود از آن استفاده نمایید.

Scientometrics

The specifications of the publisher center of this Paper are as follows:
Type of center: دانشگاه دولتی
Paper count: 70,065
In the scientometrics section of CIVILICA, you can see the scientific ranking of the Iranian academic and research centers based on the statistics of indexed articles.

New Papers

Share this page

More information about COI

COI stands for "CIVILICA Object Identifier". COI is the unique code assigned to articles of Iranian conferences and journals when indexing on the CIVILICA citation database.

The COI is the national code of documents indexed in CIVILICA and is a unique and permanent code. it can always be cited and tracked and assumed as registration confirmation ID.

Support