Investigation of Microdevice Performance by Transient Heat Transfer Simulation

Publish Year: 1391
نوع سند: مقاله ژورنالی
زبان: English
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شناسه ملی سند علمی:

JR_JAFM-3-1_002

تاریخ نمایه سازی: 27 دی 1400

Abstract:

The present work considers transient electrothermal simulation of sub-micrometer silicon device and electron-phonon interactions in electrical and thermal fields. A coupled thermal and electrical model is developed for a silicon   n  n  n structure consisting of the hydrodynamic equations for electron transport and energy conservation equations for phonon. The results indicate that, for one electric field the lattice temperature gradient has significant effect on the magnitude of electric current. The transient phonon temperature affects the device performance due to the change of mobility and gradient temperature of electron. At an external voltage of ۰.۱ V, calculations show that an increase in the junction boundary temperature by ۱۰۰ °C, cause increasing the drain current by ۱۶% at ۳ picosecond and decreases it by ۱۷% up to steady state condition.

Authors

A. Saboonchi

Department of Mechanical Engineering, Isfahan University of Technology, Isfahan, ۸۴۱۵۶-۸۳۱۱۱, Iran

J. Ghasemzadeh

Department of Mechanical Engineering, Isfahan University of Technology, Isfahan, ۸۴۱۵۶-۸۳۱۱۱, Iran