Apple defect detection using statistical histogram based EM algorithm
Publish place: 19th Iranian Conference on Electric Engineering
Publish Year: 1390
نوع سند: مقاله کنفرانسی
زبان: English
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شناسه ملی سند علمی:
ICEE19_503
تاریخ نمایه سازی: 14 مرداد 1391
Abstract:
Segmentation of an image into its components plays an important role in most of the image processing applications. In this article an important application of image processing in determination of apple quality is studied, and an automatic algorithm is proposed in order to determine apples skin color defects. First, this image is converted from RGB to color space L*a*b*. Then fruit shape is extracted by ACM algorithm. Finally, the image has segmented using SHEM algorithm. Experimental results on the acquired images show that both EM and SHEM spend the same iterations toaccomplish the segmentation process and get the same results. However, the proposed SHEM algorithm consumes less time than the standard EM algorithm. Accuracy of the proposedalgorithm on the acquired images is 91.72% and 94.86% for healthy pixels and defected ones, respectively
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Authors
Ghobad Moradi
Member of Young Researcher Club, Branch of Kermanshah Azad university, Iran
Mousa Shamsi
Faculty of Electrical Engineering Sahand University of Technology Tabriz, Iran
Mohammad Hossein Sedaaghi
Faculty of Electrical Engineering Sahand University of Technology
Setareh Moradi
Faculty of Electrical Engineering Islamic Azad University Ravansar Kermanshah
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