Design a new Cyclic Analog To Digital Convertor With Ideal Op-amp In CMOS Image Sensor

A wide dynamic range CMOS image sensor with a burst readout multiple exposure method is proposed. In this method, maximally four different exposure-time signals areread out in one frame. To achieve the high-speed readout, a compact cyclic Analog-to-Digital Converter (ADC) with noisecanceling function is proposed and arrays of the cyclic ADCsare integrated at the column. A prototype wide dynamic range CMOS image sensor has been developed with 0.25- m 1-poly 4-metal CMOS image sensor technology. The dynamic range is expanded maximally by a factor of 1791 compared to the case of single exposure. The dynamic range is measured to be 19.8 bit or 119 dB. The12-bit ADC integrated at the column of theCMOS image sensor has DNL of +0.2/ 0.8 LSB. The powerconsumption of the cyclic ADC in 3.3 V supply is 11 mw , SNDR is 40db, ENOB equal to 10 , and THD equal to -2. Finally values obtained from this paper is compared with other sample

Keywords:

cyclic analog-to-digital converter , offset canceling , optimized