Efficient Triple Modular Redundancy for Reliability Enhancement of DNNs Using Explainable AI
Publish place: 21st IRANIAN STUDENT CONFERENCE ON ELECTRICAL ENGINEERING
Publish Year: 1404
نوع سند: مقاله کنفرانسی
زبان: English
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شناسه ملی سند علمی:
ISCEE21_032
تاریخ نمایه سازی: 8 خرداد 1404
Abstract:
Deep Neural Networks (DNNs) are widely employed in safety-critical domains, where ensuring their reliability is essential. Triple Modular Redundancy (TMR) is an effective technique to enhance the reliability of DNNs in the presence of bit-flip faults. In order to handle the significant overhead of TMR, it is applied selectively on the parameters and components with the highest contribution at the model output. This paper presents an efficient TMR approach to enhance the reliability of DNNs against bit-flip faults using an Explainable Artificial Intelligence (XAI) method. Since XAI can provide valuable insights about the importance of individual neurons and weights in the performance of the network, they can be applied as the selection metric in TMR techniques. The proposed method utilizes a low-cost, gradient-based XAI technique known as Layer-wise Relevance Propagation (LRP) to calculate importance scores for DNN parameters. These scores are then used to enhance the reliability of the model, with the most critical weights being protected by TMR. The proposed approach is evaluated on two DNN models, VGG۱۶ and AlexNet, using datasets such as MNIST and CIFAR-۱۰. The results demonstrate that the method can protect the AlexNet model at a bit error rate of ۱۰-۴, achieving over ۶۰% reliability improvement while maintaining the same overhead as state-of-the-art methods.
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Authors
Kimia Soroush
School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran
Nastaran Shirazi
School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran
Mohsen Raji
School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran