A Mirali - Department of Physics, Yasouj University, Yasouj, Iran
S Hajatii - Department of Physics, Yasouj University, Yasouj, Iran
A Avazpour - Department of Physics, Yasouj University, Yasouj, Iran
S Tougaard - Department of Physics and Chemistry, University of Southern Denmark, DK-۵۲۳۰ Odense M, Denmark

We have improved XPS peak shape analysis for accurate characterization of metal nanostructures embeddedin a polymer matrix. We have determined the detailed in-depth distribution of cylindrical Au nanowire in polymer usingthe analysis of a single spectrum by taking into account the electron transport phenomena corresponding to both metaland polymer components. This means that we have made a very simple and nondestructive indirect 3D XPS imagingtechnique for inline characterization of bi-component surface nanostructures including metal and polymer. This is a verypromising technique for inline quality control of such surface nanostructures

nanometalized polymer, cylindrical gold nanowire, x-ray photoelectron spectroscopy, XPS peak shape analysis, 3D XPS imaging