Electrical properties of gold thin films during annealing temperature

In This paper, we report the results of electrical characterization of gold thin films. Au thin films were deposited by centrifugal technique on glass substrates and cross sectional image display that thickness.The electrical resistance of thin films as a function of film annealing temperature was studied and I-V diagram was exposed. AFM images indicated transformation in morphology of surfaces. Increase in temperature from ambient temperature to about 50° C, we see decrease and afterwards increase in surface resistance.

Keywords:

electrical property , surface resistance , surface morphology