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Analysis of Different Nano Imaging and Logical Relations between them

عنوان مقاله: Analysis of Different Nano Imaging and Logical Relations between them
شناسه ملی مقاله: CFCA01_062
منتشر شده در اولین کنفرانس ملی کاربرد کامپوزیت ها در صنعت ساخت در سال 1395
مشخصات نویسندگان مقاله:

Saeed Ghaffarpour Jahromi - Assistant Professor, Department of Civil Engineering, Shahid Rajaee Teacher Training
yasaman Dehghan Banadaky - Master Student in Geotechnic, Shahid Rajaee Teacher Training

خلاصه مقاله:
In order for analyzing the Nano particles area and details of materials in Nano Scale, there are used of different techniques such as AFM XRD / SEM / FT-IR / XRF / GC-MS / TEM / TGA / AA that are more applied in civil engineering. This study aims to introduce the application of such approaches, preparing the samples in each method, dealing with advantages and disadvantages of each method. In this paper, the images prepared in each approach have been completely illustrated

کلمات کلیدی:
AFM , XRD , SEM , FT-IR , XRF , GC-MS , TEM , TGA , AA , Nano-clays , Nano-Particles, nanotechnology , nanotubes

صفحه اختصاصی مقاله و دریافت فایل کامل: https://civilica.com/doc/490754/