Raman and IR characterization of nanocrystalline Indium Oxide for optoelectronics applications

Publish Year: 1395
نوع سند: مقاله کنفرانسی
زبان: English
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شناسه ملی سند علمی:

IRCEM01_002

تاریخ نمایه سازی: 25 آذر 1395

Abstract:

Nanocrystalline cubic In۲O۳ thin films were successfully synthesized by thermal evaporation of Indium on unheated Si substrates, followed by thermal wet oxidation. The synthesized products were characterized by X-ray diffraction (XRD), Fourier transform infrared (FTIR) spectroscopy, micro-Raman spectroscopy. XRD patterns confirmed the crystalline nature and cubic structure of synthesized composition. Crystallite size and strain were evaluated from the XRD data. The vibrational modes of the samples were investigated by Raman spectrum. The effects of strain and crystalline size of In۲O۳ were studied by FTIR and Raman shifts.

Authors

Maryam Amirhoseiny

Department of engineering Science, Buein Zahra Technical University, Buein Zahra, Qazvin, Iran