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Reviews of Defect Tolerance for Nano-arrays

عنوان مقاله: Reviews of Defect Tolerance for Nano-arrays
شناسه ملی مقاله: COMCONF03_222
منتشر شده در سومین کنفرانس سراسری نوآوری های اخیر در مهندسی برق و کامپیوتر در سال 1395
مشخصات نویسندگان مقاله:

Lida Kouhalvandi - Electronics and Communication Engineering, Istanbul Technical University, 34469, Istanbul, Turkey

خلاصه مقاله:
The prospect on nano-array based circuits are balanced by serious subjects related to reliability. At the present time, nanowires and active devices cannot depend on a mature technology and high rates of defects are yet to be expected. Crossbar architectures are one method to molecular electronic circuits for memory and logic applications. Defect tolerance techniques are necessary to obtain an acceptable manufacturing yield. This paper reviews an approach to building defect-tolerant, nanoscale compute fabrics out of assemblies of defective crossbars of configurable FETs and switches.

کلمات کلیدی:
Defect , Nanoarray, Percolation, Realiability

صفحه اختصاصی مقاله و دریافت فایل کامل: https://civilica.com/doc/576664/