Zahra Shirmohammdi
Nezam Rohbani - Department of Computer Engineering Sharif University of Technology Tehran, Iran
SeyedGhassem Miremadi

Crosstalk fault occurs due to coupling and inductance effects forming between long, parallel and adjacent wires of NoCs. Crosstalk faultis transition dependent fault that the severity of this fault depends on the transitions of data appearing on wires. With appearing these transitions, crosstalk faults increases linearly with coupling capacitance while logarithmically with inductance coupling between wires. In most of crosstalk talking mechanisms, only the coupling considers capacitance between wires is considered and the inductance effects are ignored. How-ever with increasing the frequency and marching the chips to the Giza Hertz domain, the effects of the inductance cannot be Ig-nored. This paper intends to inspect the effect of the inductance on the crosstalk faults and increase the effects of TODs on the wires. We have shown that 4C class of crosstalk is mitigated by the effect of inductance in nano-scale chip fabrication. Also we have showed new classes can become more serious by increase of inductance effect in new technologies.

Crosstalk Faults,Inductance, Capacitance,Network on Chips, Reliability