Dynamic Strength Scaling for Delay Fault Propagation in Nanometer Technologies
Publish place: 14th annual International CSI Computer Conference
Publish Year: 1388
نوع سند: مقاله کنفرانسی
زبان: English
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شناسه ملی سند علمی:
CSICC14_024
تاریخ نمایه سازی: 24 خرداد 1388
Abstract:
This paper proposes an algorithm for the detection of resistive delay faults in deep submicron technology using dynamic strength scaling, which is applicable for 45 nm and below. The approach uses an advanced coding system to build logical functions that are sensitive to strength and able to detect even the slightest voltage changes in the circuit. Such changes are caused by interconnection resistive behavior and result in timing-related defects
Authors
Reza Javaheri
Ryerson University/Department of Electrical and Computer Engineering, Toronto, Canada
Reza Sedaghat
Ryerson University/Department of Electrical and Computer Engineering, Toronto, Canada