Optimal test plan for reliability demonstration of one shot systems

One-shot devices and one-shot systems are required toperform a function once only since their use is normallyaccompanied by an irreversible reaction or process, e.g.chemical reaction or physical destruction. One-shotdevices and one-shot systems, electronic, mechanical orstructural, by definition, cannot be fully tested prior touse because testing in the full mode of operation usuallyresults in their total or partial destruction; or anirreversibility of a discrete part. The final system test isvery difficult and expensive, therefore we should usecomponent and sub-system tests to demonstratereliability and number of test for integrated systemshould be decreased. But, one test is necessary. In thispaper, we assume that components tested with zerofailure and a hybrid model that integrates the Bayesianmodel with the variance propagation technique isimplied. In this paper, we use GA to determine the bestnumber of tests for each component to demonstratesystem reliability. Target function is developed based ontest cost and the best test plan for a desired reliabilityand confidence level is determined.

Keywords:

Reliability , demonstrate , allocation , confidence level