Magnetic Force Microscopy using fabricated cobalt-coated carbon nanotubes probes
Publish place: Iranian Chemical Communication، Vol: 3، Issue: 3
Publish Year: 1394
نوع سند: مقاله ژورنالی
زبان: English
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شناسه ملی سند علمی:
JR_ICC-3-3_009
تاریخ نمایه سازی: 1 مرداد 1397
Abstract:
Magnetic force microscope (MFM) is a powerful technique for mapping the magnetic forcegradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used tofabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effectivetechnique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT)on the atomic force microscope (AFM) tip was investigated. The optimum voltage and frequencyof SWCNT solution are obtained as 13 volts and 2 MHz, respectively. After coating theaspreparedCNT tips with a layer of cobalt,it can be used to obtain high resolution MFM images.
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Authors
Jamal Afzali
Physics, Young Researchers Club and Elites, Islamic azad university, sanandaj branch, sanandaj, iran
Sedigheh Sadegh Hassani
Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P.O. BOX۱۴۸۵۷۳۳۱۱۱, Tehran, Iran