Logic Gate Implementation Using UTB-SOI Junction-Less Triple Gate MOSFETs With Dual Material Gate

Publish Year: 1397
نوع سند: مقاله کنفرانسی
زبان: English
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شناسه ملی سند علمی:

ECMCONF01_075

تاریخ نمایه سازی: 5 آبان 1397

Abstract:

In the present work, a simulation study of Logic Gates is implemented using Ultra-Thin Body Silicon-On-Insulator (UTB-SOI) Junction-Less Triple Gate metal oxide semiconductor field effect transistors(MOSFETs) with Dual Material Gate (JL-TG-DMG) structure. The effect of channel length scaling on thedevice performance in terms of parameters such as threshold voltage, Drain induced barrier lowering (DIBL),and Sub-threshold Swing (SS) is investigated. Plus, the logical Gates such as AND, NAND, and NOT by usingthe proposed structure is simulated. Simulation results show that the proposed UTB-SOI JL-TG-DMG hasexcellent digital performance, and near ideal SS.

Authors

Arash Yazdanpanah Goharrizi

Department of Electrical Engineering, Shahid Beheshti University, Tehran, Iran

Mohammad Tabarsi Sochelmaei

Department of Electrical Engineering, Shahid Beheshti University, Tehran, Iran