Competition of Contact Resistance and Ferroelectric Gate Oxide on the Performance of Double-Gate MoS2 Monolayer FET
Publish Year: 1397
نوع سند: مقاله کنفرانسی
زبان: English
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شناسه ملی سند علمی:
CMTS02_119
تاریخ نمایه سازی: 29 تیر 1398
Abstract:
In this work, A Ferroelectric-FET (Fe-FET) with two dimensional MoS2 as the channel material is explored. Fe-FET with contact resistance is compared with no contact resistance. Top of the barrier model along with ferroelectric model is used to investigate performance of Fe-FET. Contact resistance can highly affect current-voltage characteristic. FET with contact resistance needs higher voltage for saturation. Ferroelectric with negative capacitance increases gate capacitance and decreases sub-threshold swing. It is shown sub-threshold swing can be tuned with ferroelectric thickness.
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Authors
Shoeib Babaee Touski
Department of Electrical Engineering, Hamedan University of Technology, Hamedan ۶۵۱۵۵, Iran
Manouchehr Hosseini
Department of Electrical Engineering, Bu-Ali Sina University, Hamedan, Iran.