Investigation of the bias current and frequencyd ependenceo f the d ete ctivity of high- f. supercon du ctor transition-edge 1l? detectors

Voltage noise is a critical parameter for high sensitive bolometric IR detectors because it determines the detectivity for these types of devices. Intrinsic volt noise measurement for superconducting transition-edge bolometers made of YBCO thin film is reported in this paper. Dependency of intrinsic noise with respect to temperature in the vicinity of critical temperature is obtained for various vqlues of bias current and chopping frequencies. Effect of these two parameters on dilferent noise types -fo, superconductor is investigated. Three maior types of voltages noise were identified in our sample according to were they occurred in temperature relative to T, (,nset and the zero resistance temperature, T, ,"n,, and the dependence of the obsemed noise signal on frequency and bias current presented.