Fast Method to Determine External Incident Wave Coupling into Microstrip Crossover Embedded in High-Speed Multilayer Circuits

The fast method is presented to evaluate the effect of external incident waves on the microstrip crossovers embedded in high-speed multilayered circuit. Because of weak coupling between lines, combining the slandard Baum-Liu-Tesche (BLf) equations with lumped circuit model of cross region, the induced voltage in transmission line terminals due to the incident wave are determined in 1-20 GHz frequency range and the obtained results of this method are compared with which obtained by CST full-wave software tool.

Keywords:

Orthogonal microship lines , incident waves , multilayered media , coupling