The most optimal surface morphology of ZnO thin films for use in solar cells

In this study, the Zinc Oxide thin films are provided by sol gel method on glass substrate and the data of atomic force microscopy which resulted from the characterization of ZnO thin films examined under three annealing temperatures as 200, 300, 400°C. In order to achieve to the best surface morphology of the optimized surface, the results of this study show that increasing the annealing temperature, both the interface width (w) and the lateral correlation length (ξ) reach to their minimum and maximum value in 300°C and 400°C, respectively. The value of roughness exponent (α) increases by increasing the annealing temperature, as it has minimum and maximum value in 200 and 400 °C, respectively. Finally, the most optimal surface morphology of ZnO thin films for use in solar cells is 300 °C.

Keywords:

Surface morphology , Thin film , Zinc Oxide , Sol gel , Annealing temperature , Solar cell