Reliability Model of 850 nm PhC-VCSELs for FSK Modulation of SCADA Systems
Publish place: 3rd International Conference on Technology Development in Electrical Engineering of Iran
Publish Year: 1399
Type: Conference paper
Language: English
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Document National Code:
ECMCONF03_009
Index date: 15 June 2020
Reliability Model of 850 nm PhC-VCSELs for FSK Modulation of SCADA Systems abstract
This paper presents a reliability model for the photonic crystal vertical-cavity surface-emitting lasers (PhC VCSELs) for FSK modulation of SCADA systems. The PhC VCSELs are evaluated in terms of various reliability parameters, including the time to failure, modulation response and modulation bandwidth. The extracted reliability performance values of PhC VCSELs are compared with those of the conventional VCSELs. Furthermore, the PhC VCSEL shows an average of 10X improvement in time to failure than that of the similar conventional VCSEL. The results indicate that the PhC VCSEL seems to be the most optimal choice for transferring the characteristics of a carrier signal in high modulation bandwidth and reliability modulation process in SCADA system
Reliability Model of 850 nm PhC-VCSELs for FSK Modulation of SCADA Systems Keywords:
Reliability model , FSK modulation , Supervisory ccontrol and data acquisition (SCADA) , Photnic crystal (PhC) , Vertical vacity surface emmiting laser (VCSEL).
Reliability Model of 850 nm PhC-VCSELs for FSK Modulation of SCADA Systems authors
Hamid Mousavi - Saeid Marjani
Khorasan Regional Electrical Company, Mashhad ۹۱۷۳۵۱۸۵, Iran
Saeid Marjani
Khorasan Regional Electrical Company, Mashhad ۹۱۷۳۵۱۸۵, Iran
Mahmoud Kamel
Khorasan Regional Electrical Company, Mashhad ۹۱۷۳۵۱۸۵, Iran
Saeid Nasiri
Khorasan Regional Electrical Company, Mashhad ۹۱۷۳۵۱۸۵, Iran