An overview of scanning near-field optical microscopy in characterization of nano-materials
Publish place: International Journal of Nano Dimension، Vol: 5، Issue: 3
Publish Year: 1393
نوع سند: مقاله ژورنالی
زبان: English
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شناسه ملی سند علمی:
JR_IJND-5-3_001
تاریخ نمایه سازی: 24 تیر 1401
Abstract:
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of diverse SNOM methods mostly based on aperture and aperture-less is presented.
Keywords:
Scanning Near-Field Optical Microscopy , Scanning probe microscope , Nano structures , Optical microscopy , Aperture less SNOM , Photon scanning tunneling microscopy , Optical fiber
Authors
Z. Sobat
Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P. O. Box: ۱۴۸۵۷۳۳۱۱۱, Tehran, Iran.
S. Sadegh Hassani
Catalysis and nanotechnology research division, research institute of petroleum industry, P. O. Box: ۱۴۸۵۷۳۳۱۱۱, Tehran, Iran.