Simulation tool development for modeling pn-junctions (diodes) under forward bias based on one-dimensional drift-diffusion
Publish place: First Annual Conference on Smart Materials and Structures
Publish Year: 1400
Type: Conference paper
Language: English
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Document National Code:
ACSMS01_030
Index date: 7 November 2022
Simulation tool development for modeling pn-junctions (diodes) under forward bias based on one-dimensional drift-diffusion abstract
Goal of this paper is to develop a one-dimensional (1D) drift-diffusion simulator for modeling pn- junctions (diodes) under forward bias conditions. P-n junction diodes form the basis not only of solar cells, but of many other electronic devices such as LEDs, lasers, photodiodes and bipolar junction transistors (BJTs). A p-n junction aggregates the recombination, generation, diffusion and drift effects described into a single device. A p-n junction with no external inputs represents an equilibrium between carrier generation, recombination, diffusion and drift in the presence of the electric field in the depletion region. Both types of carriers must be included in the model (electrons and holes). Finite difference expressions should be used for electron and hole continuity equations using the Sharfetter-Gummel discretization scheme. The work presented in this dissertation showed promising results for simulating pn junctions (diodes).
Simulation tool development for modeling pn-junctions (diodes) under forward bias based on one-dimensional drift-diffusion Keywords:
Simulation tool development for modeling pn-junctions (diodes) under forward bias based on one-dimensional drift-diffusion authors
Iman Sohrabi Moghadam Chafjiri
College of Skills and Entrepreneurship, Lahijan Branch, Islamic Azad University, Lahijan, Iran