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Impact of p-type semiconductor substrate on the transient response of metal-semiconductor-metal photodetector

Publish Year: 1402
Type: Journal paper
Language: English
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Document National Code:

JR_JTAP-17-1_008

Index date: 29 April 2023

Impact of p-type semiconductor substrate on the transient response of metal-semiconductor-metal photodetector abstract

In this paper, using finite difference method, the effect of adding a p-layer at the back of a metal-semiconductor-metal (MSM) photodetector (PD) on the spatial electric charge distribution and the transient response of the device is numerically studied. To this aim, the fundamental equations of the semiconductor device, i.e., two current continuity time-dependent equations have been considered coupled with Poisson's equation. The I-V curve of the MSM photodetector is obtained as the main characteristics of each semiconductor device. Moreover, the variations of electrostatic potential, electron and hole concentrations are determined in the MSM photodetector with a p-layer at the back of the active layer. It is observed that the peak transient response of an MSM device is improved by back-gating the device as more electrons are injected to the semiconductor layer and the slower charge carriers (the holes) to be removed from the top circuit.

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Impact of p-type semiconductor substrate on the transient response of metal-semiconductor-metal photodetector authors

Ali Barkhordari

Faculty of Physics, Shahid Bahonar University of Kerman, Kerman, Iran

Hamid Mashayekhi

Faculty of Physics, Shahid Bahonar University of Kerman, Kerman, Iran

Şemsettin Altındal

Department of Physics, Faculty of Sciences, Gazi University, Ankara, Turkey

Süleyman Özçelik

Department of Photonics, Faculty of Applied Sciences, Gazi University, Ankara, Turkey

Yashar Azizian-Kalandaragh

Photonics Application and Research Center, Gazi University, Ankara, Turkey