Production and evaluation of bread wheat doubled haploid lines with resistance to stem rust (Puccinia graminis f. sp. tritici)

Stem rust, caused by Puccinia graminis f. sp. tritici, is a devastating wheat disease, which  can cause serious grain yield reduction. Doubled haploid (DH) technique reduces the time required for the development of new varieties by up to almost five years. In this study, three F۱ wheat hybrids including W۱: Ghods*۳/MV۱۷, W۲: Flanders/۳*Ghods and W۳: Hybrid de Bersee/۳*Ghods along with three maize genotypes, H۱: KSC ۱۰۸, H۲: SC ۳۰۱ and H۳: SC ۷۰۴, along with a mixture of pollen grains of these three genotypes (H۴) were used to generate DH lines. During DH lines production some characteristics, such as percentage of seed set, haploid embryo and haploid plantlets, were studied. In total, ۱۵۰ DH lines resulting from all crosses, along with their parents and three check cultivars, Parsi, Mihan and Bolani, were evaluated for their infection type to Pgt races PTMNC, TTSTK and TTKSK. Results indicated that differences between check cultivars for coefficient of infection induced with race PTMNC at the adult plant stage was significant. Also, for infection type at the seedling stage, differences between check cultivars inoculated with race TTSTK were significant (P<۰.۰۱), but non-significant reactions were observed for races PTMNC and TTKSK. Cluster analysis based on infection type and coefficient of infection showed that DH lines were classified into two major groups of susceptible and resistant when induced with all three races. In general, out of ۱۵۰ DH lines that were evaluated at the adult plant stage with race PTMNC, ۴۱ lines were resistant, and ۱۰۹ lines were susceptible, while more than ۵۰% of resistant lines belonged to the W۳ population.

Keywords:

Wheat , Doubled haploid , Race , Stem rust