CALCULATION OF OPTICAL PROPERTIES OF MgF2 /TiO2/GLASS AND MgF2/Ag/GLASS MULTILAYERS SEMICONDUCTORS BY KRAMERS-KRONIG METHOD

Magnesium fluoride thin films with the thickness of 93 nm were deposited on MgF2/glass and Ag/glass thin layers by resistance evaporation method under UHV conditions, by rotating pre layer for sample one and normal deposition for sample two. Their optical properties were measured by spectrophotometer in the spectral range of 300 −1100nm wave length (VIS). The optical constants such as, the real part of refractive index (n), imaginary part of refractive index (k), real and imaginary parts of dielectric function ε1, ε2 respectively and absorption coefficient (α), were obtained from the Kramers-Kronig analysis of the reflectivity curves. Band-gap energy was also estimated for these films