Bayesian inference of reliability in the case of zero-failure data for the binomial distribution
Publish Year: 1403
Type: Journal paper
Language: English
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Document National Code:
JR_SMPS-1-2_005
Index date: 20 December 2024
Bayesian inference of reliability in the case of zero-failure data for the binomial distribution abstract
This article explores Bayesian inference for the reliability of the binomial distribution in cases with zero-failure data. We propose Expected-Bayesian (E-Bayesian) and hierarchical Bayesian estimators of reliability, considering three different joint prior distributions of hyper-parameters in the prior distribution of reliability, which is assumed to follow a beta distribution. We derive closed-form expressions for the E-Bayesian estimators of reliability and propose hierarchical Bayesian estimators, which are subsequently evaluated using Monte Carlo simulations. Furthermore, we study the one-sided modified Bayesian (M-Bayesian) lower credible limits for reliability. The performance of the proposed methods is demonstrated through Monte Carlo simulations. Finally, a real data example is analyzed for illustrative purposes.
Bayesian inference of reliability in the case of zero-failure data for the binomial distribution Keywords:
Bayesian inference of reliability in the case of zero-failure data for the binomial distribution authors
Yuting Jiang
Southwest Jiaotong University Hope College, Chengdu ۶۱۰۴۰۰, China
Xuefeng Feng
Department of Statistics, Southwest Jiaotong University, Chengdu ۶۱۱۷۵۶, China