Determination of specific surface area of porous materials by SAXS

Small angle X-ray scattering (SAXS) is one of the most rapidly growing techniques in solid-state characterization. This is largely because of the fact that the structure ofmaterials at the nanoscale (1-100nm) is often important in determining quality of materials [1, 2]. Specific surface area can be measured by SAXS by relating the tail-end constant of the small –angle curve to the integral scattering of the material [1]. Silica gel and aluminium oxide are the most popularamong sorbents acting as supports for polymers and catalysts. In present research, specific surface area for silica-gel, aluminium oxide and silica-alumina are measured by calculation method based on the data from SAXS analysis and these amounts are compared with corresponding BET values