Simulation of Bayard Alpert ionization vacuum gauge with COMSOL
Publish place: Fifth International Conference on Electrical and Computer Engineering with Emphasis on Indigenous Knowledge
Publish Year: 1396
نوع سند: مقاله کنفرانسی
زبان: English
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شناسه ملی سند علمی:
COMCONF05_537
تاریخ نمایه سازی: 21 اردیبهشت 1397
Abstract:
In this paper, the Bayard Alpert ionization vacuum gauge has been simulated using COMSOL. Employing Charged Particle Tracing (CPT) tool in COMSOL, the sensitivity coefficient of the gauge has been calculated from simulation results. Based on the results, the average measured value of sensitivity is 30, which shows compatibility with theoretical value of 28. It must be mentioned that a unique method is used in this article to calculate the sensitivity coefficient and the coefficient diagrams for sensitivity of different vacuum pressures have been obtained through these simulations. This paper also presents a method for obtaining electron velocity and energy and their diagrams
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Authors
Sadegh Mohammadzadeh Bazarchi
Department of Electronic Engineering, Faculty of Ghazi Tabatabai, Urmia Branch, Technical and vocational University (TVU), Tehran, Iran,
Ebrahim abaspoor sani
Faculty of Electrical and Computer Engineering, Urmia University, Urmia, Iran