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Fault Tolerant Reversible QCA Design using TMR and Fault Detecting by a Comparator Circuit

Publish Year: 1390
Type: Journal paper
Language: English
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Document National Code:

JR_JACR-2-4_007

Index date: 6 September 2016

Fault Tolerant Reversible QCA Design using TMR and Fault Detecting by a Comparator Circuit abstract

Quantum-dot Cellular Automata (QCA) is an emerging and promising technology that provides significant improvements over CMOS. Recently QCA has been advocated as an applicant for implementing reversible circuits. However QCA, like other Nanotechnologies, suffers from a high fault rate. The main purpose of this paper is to develop a fault tolerant model of QCA circuits by redundancy in hardware and also identifying the faulty module by a proposed Reversible QCA comparator circuit. Triple Module Redundancy (TMR) mechanism is implemented for Reversible QCA circuits to make them more Reliable. Our proposed Comparator and Detector design uses the minimum number of clocking zones and maximizes the circuit density and focuses on a layout of the circuit which is minimal in using QCA cells. QCA Designer ver.2.0.3 is used for simulation and verifying the design.

Fault Tolerant Reversible QCA Design using TMR and Fault Detecting by a Comparator Circuit Keywords:

Fault Tolerant Reversible QCA Design using TMR and Fault Detecting by a Comparator Circuit authors

Zahra Mohammadi

Department of Computer Engineering, Arak branch, Islamic Azad University, Arak, Iran

Majid Mohammadi

Department of Computer Engineering, Shahid Bahonar University, Kerman, Iran