Analysis of Different Nano Imaging and Logical Relations between them
Publish Year: 1395
نوع سند: مقاله کنفرانسی
زبان: English
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شناسه ملی سند علمی:
CFCA01_062
تاریخ نمایه سازی: 16 شهریور 1395
Abstract:
In order for analyzing the Nano particles area and details of materials in Nano Scale, there are used of different techniques such as AFM XRD / SEM / FT-IR / XRF / GC-MS / TEM / TGA / AA that are more applied in civil engineering. This study aims to introduce the application of such approaches, preparing the samples in each method, dealing with advantages and disadvantages of each method. In this paper, the images prepared in each approach have been completely illustrated
Keywords:
AFM , XRD , SEM , FT-IR , XRF , GC-MS , TEM , TGA , AA , Nano-clays , Nano-Particles , nanotechnology , nanotubes
Authors
Saeed Ghaffarpour Jahromi
Assistant Professor, Department of Civil Engineering, Shahid Rajaee Teacher Training
yasaman Dehghan Banadaky
Master Student in Geotechnic, Shahid Rajaee Teacher Training