A Novel method for the calculation of refractive index and extinction coefficient of thin films

In this study, some major discrepancies of scientific literature in the calculation of optical constants of thin films were addressed. A reliable two term equation was used to estimate extinction coefficient of thin films. A novel numerical algorithm was developed to determine the refractive index of coating materials. An error source due to the oscillating term of interference pattern in the transmission and reflection spectrums was discovered, and the proper approach for eliminating this kind of error was introduced. Electron beam evaporation method was used to synthesize mixed alumina-zirconia and pure germanium thin films. The generated algorithm was applied to estimate the optical constants of deposited thin films. The results of the present study accurately support the earlier scientific reports.

A Novel method for the calculation of refractive index and extinction coefficient of thin films Keywords:

Refractive Index , Extinction Coefficient , Thin Film , Transmission , Reflection