Applied sequential sampling plan in the truncated life test
Publish place: 13th International Industrial Engineering Conference
Publish Year: 1395
Type: Conference paper
Language: English
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Document National Code:
IIEC13_066
Index date: 5 September 2017
Applied sequential sampling plan in the truncated life test abstract
The lifetime of a product is expected to be high, thus it isusual to terminate the life test at a prefixed time. This typeof test for evaluating the lifetime of a product is calledtruncated life test. It is assumed the lifetime of a product asits quality characteristic and the sequential sampling plan isapplied in the context of truncated life test. In the sequentialsampling the samples are selected from the lot stage tostage. In each stage the total number of inspected item andthe total number of defective items to that stage is specifiedand based on them it is decided whether to continuesampling, cease it or take another sample. Finally, byillustrating an example the application of the sequentialsampling is indicated for the truncated life test.
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Applied sequential sampling plan in the truncated life test authors
Mohammad Saber Fallahnezhad
Department of industrial engineering, University of Yazd, Yazd university, Yazd, Iran
Hasan Rasay
Department of industrial engineering, University of Yazd, Yazd university, Yazd, Iran
Morteza Pourgharibshahi
cDepartment of industrial engineering, University of Yazd, Yazd university, Yazd, Iran