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Magnetic Force Microscopy using fabricated cobalt-coated carbon nanotubes probes

Publish Year: 1394
Type: Journal paper
Language: English
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Document National Code:

JR_ICC-3-3_009

Index date: 23 July 2018

Magnetic Force Microscopy using fabricated cobalt-coated carbon nanotubes probes abstract

Magnetic force microscope (MFM) is a powerful technique for mapping the magnetic forcegradient above the sample surface. Herein, single-wall carbon nanotubes (SWCNT) were used tofabricate MFM probe by dielectrophoresis method which is a reproducible and cost-effectivetechnique. The effect of induced voltage on the deposition manner of carbon nanotubes (CNT)on the atomic force microscope (AFM) tip was investigated. The optimum voltage and frequencyof SWCNT solution are obtained as 13 volts and 2 MHz, respectively. After coating theaspreparedCNT tips with a layer of cobalt,it can be used to obtain high resolution MFM images.

Magnetic Force Microscopy using fabricated cobalt-coated carbon nanotubes probes Keywords:

Magnetic Force Microscopy using fabricated cobalt-coated carbon nanotubes probes authors

Jamal Afzali

Physics, Young Researchers Club and Elites, Islamic azad university, sanandaj branch, sanandaj, iran

Sedigheh Sadegh Hassani

Catalysis and Nanotechnology Research Division, Research Institute of Petroleum Industry, P.O. BOX۱۴۸۵۷۳۳۱۱۱, Tehran, Iran